Author of the publication

All-Digital Process-Variation-Calibrated Timing Generator for ATE With 1.95-ps Resolution and Maximum 1.2-GHz Test Rate.

, , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (6): 1015-1025 (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

An MTJ-based non-volatile flip-flop for high-performance SoC., , , , , and . I. J. Circuit Theory and Applications, 42 (4): 394-406 (2014)MTJ based non-volatile flip-flop in deep submicron technology., , , , , and . ISOCC, page 424-427. IEEE, (2011)A 90° phase-shift DLL with closed-loop DCC for high-speed mobile DRAM interface., , and . IEEE Trans. Consumer Electronics, 56 (4): 2400-2405 (2010)All-Digital Process-Variation-Calibrated Timing Generator for ATE With 1.95-ps Resolution and Maximum 1.2-GHz Test Rate., , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (6): 1015-1025 (2018)ADDLL for Clock-Deskew Buffer in High-Performance SoCs., , , and . IEEE Trans. Very Large Scale Integr. Syst., 21 (7): 1368-1373 (2013)A Novel Sensing Circuit for Deep Submicron Spin Transfer Torque MRAM (STT-MRAM)., , , and . IEEE Trans. Very Large Scale Integr. Syst., 20 (1): 181-186 (2012)A Magnetic Tunnel Junction Based Zero Standby Leakage Current Retention Flip-Flop., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 20 (11): 2044-2053 (2012)All-Digital 90° Phase-Shift DLL With Dithering Jitter Suppression Scheme., , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (3): 1015-1024 (2016)Level-Converting Retention Flip-Flop for Reducing Standby Power in ZigBee SoCs., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (3): 413-421 (2015)Process Variation Tolerant All-Digital 90° Phase Shift DLL for DDR3 Interface., , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 59-I (10): 2186-2196 (2012)