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Neighbor selection for variance reduction in I_DDQ and other parametric data.

, , , and . ITC, page 92-100. IEEE Computer Society, (2001)

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Screening MinVDD Outliers Using Feed-Forward Voltage Testing., , , , , , , and . ITC, page 673-682. IEEE Computer Society, (2002)Detection of Temperature Sensitive Defects Using ZTC., , , and . VTS, page 185-192. IEEE Computer Society, (2004)ATE Value Add through Open Data Collection.. ITC, page 1430. IEEE Computer Society, (2004)Impact of Multiple-Detect Test Patterns on Product Quality., , , , , , , and . ITC, page 1031-1040. IEEE Computer Society, (2003)Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs., , , and . VTS, page 39-46. IEEE Computer Society, (2003)Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies., , , and . VTS, page 69-74. IEEE Computer Society, (2002)New Test Paradigms for Yield and Manufacturability.. ITC, page 13. IEEE Computer Society, (2004)Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data., , , and . ITC, page 1240. IEEE Computer Society, (2002)ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test., , , , and . ITC, page 181-189. IEEE Computer Society, (2004)Variance reduction and outliers: statistical analysis of semiconductor test data., and . ITC, page 9. IEEE Computer Society, (2005)