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Dark Count Rate Modeling in Single-Photon Avalanche Diodes for Space LIDAR Applications., , , , , and . NEWCAS, page 1-4. IEEE, (2019)Analysis and optimization of noise response for low-noise CMOS image sensors., , , and . NEWCAS, page 513-516. IEEE, (2012)CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current., , , , , and . Sensors, 19 (24): 5534 (2019)The essential contribution of CMOS imaging technologies to Earth Observation applications.. ESSDERC, page 35-42. IEEE, (2021)Dark Count Rate Modeling in Single-Photon Avalanche Diodes., , , , , and . IEEE Trans. Circuits Syst. I Fundam. Theory Appl., 67-I (5): 1507-1515 (2020)Plasma Antenna Charging in CMOS Image Sensors., , , and . IRPS, page 1-5. IEEE, (2019)Modeling of Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors., , , , , , and . SMACD, page 101-104. IEEE, (2019)Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors., , , , , , , and . IRPS, page 67. IEEE, (2024)A Fast Method for Modeling and Optimizing Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors., , , , , , and . ESSDERC, page 230-233. IEEE, (2019)Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage., , , , , , , and . Sensors, 19 (24): 5550 (2019)