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Innovative practices session 4C: Disruptive solutions in the non-digital world.

, , , , and . VTS, page 1. IEEE Computer Society, (2014)

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Mid-bond Interposer Wire Test., , , , and . Asian Test Symposium, page 153-158. IEEE Computer Society, (2013)Test Metrics for Analog Parametric Faults., and . VTS, page 226-235. IEEE Computer Society, (1999)The P1149.4 Mixed Signal Test Bus: Costs and Benefits.. ITC, page 444-450. IEEE Computer Society, (1995)BIST vs. ATE: need a different vehicle?. ITC, page 1148. IEEE Computer Society, (1998)Innovative practices session 4C: Disruptive solutions in the non-digital world., , , , and . VTS, page 1. IEEE Computer Society, (2014)Noise-Insensitive Digital BIST for any PLL or DLL., and . J. Electron. Test., 24 (5): 461-472 (2008)A low cost 100 MHz analog test bus.. VTS, page 60-65. IEEE Computer Society, (1995)Experiences with parametric BIST for production testing PLLs with picosecond precision., , and . ITC, page 410-418. IEEE Computer Society, (2010)IC Mixed-Signal BIST: Separating Facts from Fiction.. ITC, page 1205. IEEE Computer Society, (2002)Adaptive parametric BIST of high-speed parallel I/Os via standard boundary scan., and . ITC, page 1-9. IEEE Computer Society, (2011)