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Disambiguation of "Afsar, Mohammed N."

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High-Resolution High-Power Quasi-Optical Free-Space Spectrometer for Dielectric and Magnetic Measurements in Millimeter Waves.

, , , , and . IEEE Trans. Instrumentation and Measurement, 58 (8): 2671-2678 (2009)

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Filiz Afsar

Ali Afsar

Nida Afsar

Mohammed Mohammed

 

Other publications of authors with the same name

Millimeter-Wave Transmittance and Reflectance Measurement on Pure and Diluted Carbonyl Iron., , , and . IEEE Trans. Instrumentation and Measurement, 59 (8): 2198-2203 (2010)Broadband Dielectric Measurements on Highly Scattering Materials., , , , and . IEEE Trans. Instrumentation and Measurement, 59 (5): 1397-1405 (2010)Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths., , and . IEEE Trans. Instrumentation and Measurement, 57 (4): 706-715 (2008)Measurement of Broadband Dielectric Properties of Cyclohexane, Chlorobenzene, 10% Formalin, and 1, 4-Dioxane Using Dispersive Fourier Transform Spectroscopy., and . IEEE Trans. Instrumentation and Measurement, 56 (6): 2354-2359 (2007)Non-contact dielectric characterization of lithium ionic solid electrolyte polymer., , , and . I2MTC, page 925-930. IEEE, (2013)Assessment of random and systematic errors in millimeter-wave dielectric measurement using open resonator and Fourier transform spectroscopy systems., , and . IEEE Trans. Instrumentation and Measurement, 53 (4): 899-906 (2004)Millimeter-Wave Transmittance Measurements on Ferrites Near Ferromagnetic Resonance., , and . IEEE Trans. Instrumentation and Measurement, 57 (7): 1388-1393 (2008)Ultra high-Q 60GHz open resonator system for precision dielectric permittivity and loss tangent measurements., and . I2MTC, page 1-5. IEEE, (2018)High-resolution absorption coefficient and refractive index spectra of carbon monoxide gas at millimeter and submillimeter wavelengths., and . IEEE Trans. Instrumentation and Measurement, 55 (4): 1033-1037 (2006)A novel open-resonator system for precise measurement of permittivity and loss-tangent., and . IEEE Trans. Instrumentation and Measurement, 50 (2): 402-405 (2001)