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Retention-Aware DRAM Assembly and Repair for Future FGR Memories.

Y. Wang, Y. Han, C. Wang, H. Li, и X. Li. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (5): 705-718 (2017)

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Li Li

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Why current secure scan designs fail and how to fix them?A. Cui, Y. Luo, H. Li, и G. Qu. Integr., (2017)A New Multiple-Round Dimension-Order Routing for Networks-on-Chip.B. Fu, Y. Han, H. Li, и X. Li. IEICE Trans. Inf. Syst., 94-D (4): 809-821 (2011)MEC: An Open-source Fine-grained Mapping Equivalence Checking Tool for FPGA.L. Ni, Z. Yang, J. Zhang, C. Feng, J. Liu, G. Luo, H. Li, B. Xie, и X. Li. CoRR, (2023)ApproxABFT: Approximate Algorithm-Based Fault Tolerance for Vision Transformers.X. Xue, C. Liu, H. Huang, Y. Wang, B. Yang, T. Luo, L. Zhang, H. Li, и X. Li. CoRR, (2023)HyCA: A Hybrid Computing Architecture for Fault Tolerant Deep Learning.D. Xu, Q. Wang, C. Liu, C. Chu, Y. Wang, H. Li, X. Li, и K. Cheng. CoRR, (2021)Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors.Y. Zhang, K. Chakrabarty, Z. Peng, A. Rezine, H. Li, P. Eles, и J. Jiang. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (3): 714-727 (2020)Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug.Y. Cheng, H. Li, Y. Wang, и X. Li. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (4): 767-779 (2019)A Fast Precision Tuning Solution for Always-On DNN Accelerators.Y. Wang, Y. He, L. Cheng, H. Li, и X. Li. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (5): 1236-1248 (2022)Abstraction-Guided Simulation Using Markov Analysis for Functional Verification.J. Wang, H. Li, T. Lv, T. Wang, X. Li, и S. Kundu. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (2): 285-297 (2016)HyCA: A Hybrid Computing Architecture for Fault-Tolerant Deep Learning.C. Liu, C. Chu, D. Xu, Y. Wang, Q. Wang, H. Li, X. Li, и K. Cheng. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3400-3413 (2022)

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Li Li

Li Li

Li Li

Li Li

Li Li

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