Author of the publication

Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test.

, , , , and . LATW, page 1-4. IEEE Computer Society, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Robust Pattern Generation for Small Delay Faults Under Process Variations., , , , , , and . ITC, page 111-116. IEEE, (2023)Efficient Pattern Mapping for Deterministic Logic BIST., , , , , and . ITC, page 48-56. IEEE Computer Society, (2004)Adapting an SoC to ATE Concurrent Test Capabilities., , , and . ITC, page 1169-1175. IEEE Computer Society, (2002)Application of deterministic logic BIST on industrial circuits., , , and . ITC, page 105-114. IEEE Computer Society, (2000)Using mission logic for embedded testing., and . DATE, page 805. IEEE Computer Society, (2001)Optimized Selection of Frequencies for Faster-Than-at-Speed Test., , , , , and . ATS, page 109-114. IEEE Computer Society, (2015)Soft error correction in embedded storage elements., and . IOLTS, page 169-174. IEEE Computer Society, (2011)Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits., and . FTCS, page 36-41. IEEE Computer Society, (1988)Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms., , , and . EDCC, volume 1667 of Lecture Notes in Computer Science, page 339-350. Springer, (1999)ETS 2015 best paper., and . ETS, page 1. IEEE, (2016)