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Disambiguation of "Stratigopoulos, Haralampos-G. D."

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IP Session on Machine Learning Applications in IC Test-Related Tasks.

, , , , , , , and . VTS, page 1. IEEE, (2019)

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Haralampos Kouris

Haralampos Kiriakidis

Haralampos Papadopoulos

Haralampos Gousis

Haralampos Theodoros Gouveris

 

Other publications of authors with the same name

Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times., , , , , and . ITC, page 1-7. IEEE, (2015)Diagnosis of Local Spot Defects in Analog Circuits., , , , , and . IEEE Trans. Instrumentation and Measurement, 61 (10): 2701-2712 (2012)Adaptive Alternate Analog Test., and . IEEE Des. Test Comput., 29 (4): 71-79 (2012)Spiking Neuron Hardware-Level Fault Modeling., , , , , , and . IOLTS, page 1-4. IEEE, (2020)One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits., , and . IEEE Trans. Circuits Syst. I Regul. Pap., 63-I (11): 2022-2035 (2016)Concurrent detection of erroneous responses in linear analog circuits., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (5): 878-891 (2006)An Analog Checker with Input-Relative Tolerance for Duplicate Signals., and . J. Electron. Test., 20 (5): 479-488 (2004)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , and 7 other author(s). MWSCAS, page 1081-1084. IEEE, (2014)Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors., , , , , and . ISVLSI, page 627. IEEE Computer Society, (2015)Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST., , , and . VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 129-148. Springer, (2014)