Author of the publication

Testing the Configurable Analog Blocks of Field Programmable Analog Arrays.

, , , , and . ITC, page 893-902. IEEE Computer Society, (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Which metrics to use for RF indirect test strategy?, , , , , and . SMACD, page 73-76. IEEE, (2019)Accurate and efficient analytical electrical model of antenna for NFC applications., , , , , , , and . NEWCAS, page 1-4. IEEE, (2013)Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE)., and . NEWCAS, page 197-200. IEEE, (2012)Improving Defect Detection in Static-Voltage Testing., , and . IEEE Des. Test Comput., 19 (6): 83-89 (2002)Combining Functional and Structural Approaches for Switched-Current Circuit Testing., , , and . J. Electron. Test., 16 (3): 259-267 (2000)EVM measurement of RF ZigBee transceivers using standard digital ATE., , , and . DFT, page 1-6. IEEE, (2020)On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints., , , , , , , , , and . J. Electron. Test., 34 (3): 281-290 (2018)Estimating Static Parameters of A-to-D Converters from Spectral Analysis., , , , , and . LATW, page 174-179. IEEE, (2002)An electrical test method for MEMS convective accelerometers: Development and evaluation., , , , and . DATE, page 806-811. IEEE, (2011)Delay Testing of MOS Transistor with Gate Oxide Short., , , and . Asian Test Symposium, page 168-173. IEEE Computer Society, (2003)