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Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection.

, , , , , , , , and . IRPS, page 1-4. IEEE, (2021)

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Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection., , , , , , , , and . IRPS, page 1-4. IEEE, (2021)Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications., , , , , , , , and . IRPS, page 1-5. IEEE, (2023)A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures., , , , , , , , , and 3 other author(s). IRPS, page 45-1. IEEE, (2022)A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology., , , , , , , and . IRPS, page 1-5. IEEE, (2020)A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28 nm node., , , , , , and . Microelectron. Reliab., 54 (9-10): 2306-2309 (2014)Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area., , , , , , , and . IRPS, page 1-6. IEEE, (2021)22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability., , , , , , and . IRPS, page 4. IEEE, (2022)Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability., , , , , , , , , and 1 other author(s). IRPS, page 1-4. IEEE, (2019)