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An electrical-level superposed-edge approach to statistical serial link simulation.

, , , and . ICCAD, page 717-724. ACM, (2009)

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An electrical-level superposed-edge approach to statistical serial link simulation., , , and . ICCAD, page 717-724. ACM, (2009)Propagation and interference in lossy microelectronic integrated circuits.. Massachusetts Institute of Technology, Cambridge, MA, USA, (1990)ndltd.org (oai:dspace.mit.edu:1721.1/14024).