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Nonlinear Codes for Control Flow Checking., и . ETS, стр. 1-6. IEEE, (2020)PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community., , , , , , , и . ETS, стр. 1-10. IEEE, (2020)Holding Conferences Online due to COVID-19: The DATE Experience., и . IEEE Des. Test, 37 (3): 116-118 (2020)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , и . J. Electron. Test., 29 (3): 331-340 (2013)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , и 1 other автор(ы). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , и . Microprocess. Microsystems, (2017)Helper Data Masking for Physically Unclonable Function-Based Key Generation Algorithms., , , , , , и . IEEE Access, (2022)Introduction to the Special Issue on CAD for Security: Pre-silicon Security Sign-off Solutions Through Design Cycle., , , и . ACM J. Emerg. Technol. Comput. Syst., 19 (1): 4:1-4:4 (января 2023)Python Framework for Modular and Parametric SPICE Netlists Generation., , и . CoRR, (2023)On-chip test comparison for protecting confidential data in secure ICs., , , и . European Test Symposium, стр. 1. IEEE Computer Society, (2012)