Author of the publication

Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs.

, , , , , , and . Microelectron. Reliab., 46 (9-11): 1657-1663 (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al2O3 dielectrics of different thickness., , , , , , , and . Microelectron. Reliab., 53 (9-11): 1333-1337 (2013)Variability in Resistive Memories., , , , , , , , , and 10 other author(s). Adv. Intell. Syst., (June 2023)True Random Number Generator Based on the Variability of the High Resistance State of RRAMs., , , , , , , and . IEEE Access, (2023)Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors., , , , , and . IRPS, page 1-4. IEEE, (2020)Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs., , , , , , and . Microelectron. Reliab., 46 (9-11): 1657-1663 (2006)An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance., , , , and . DCIS, page 1-6. IEEE, (2022)Device variability tolerance of a RRAM-based self-organizing neuromorphic system., , , , , , and . IRPS, page 4-1. IEEE, (2018)Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides., , , , , , , and . Microelectron. Reliab., 42 (9-11): 1501-1504 (2002)Field-effect control of breakdown paths in HfO2 based MIM structures., , , , , , and . Microelectron. Reliab., 53 (9-11): 1346-1350 (2013)Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates., , , , and . Microelectron. Reliab., 55 (9-10): 1442-1445 (2015)