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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. DSN, page 467-478. IEEE Computer Society, (2014)

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Large scale Itanium® 2 processor OLTP workload characterization and optimization.G. Saylor, and B. Khessib. DaMoN, page 3. ACM, (2006)Data Management Issues in Supporting Large-Scale Web Services.P. Bernstein, N. Dani, B. Khessib, R. Manne, and D. Shutt. IEEE Data Eng. Bull., 29 (4): 3-9 (2006)Underprovisioning backup power infrastructure for datacenters.D. Wang, S. Govindan, A. Sivasubramaniam, A. Kansal, J. Liu, and B. Khessib. ASPLOS, page 177-192. ACM, (2014)Rain or Shine? - Making Sense of Cloudy Reliability Data.I. Narayanan, B. Sharma, D. Wang, S. Govindan, L. Caulfield, A. Sivasubramaniam, A. Kansal, J. Liu, B. Khessib, and K. Vaid. ICDCS, page 218-229. IEEE Computer Society, (2017)Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. DSN, page 467-478. IEEE Computer Society, (2014)Using Solid State Drives as a Mid-Tier Cache in Enterprise Database OLTP Applications.B. Khessib, K. Vaid, S. Sankar, and C. Zhang. TPCTC, volume 6417 of Lecture Notes in Computer Science, page 153-168. Springer, (2010)Time and Cost-Efficient Modeling and Generation of Large-Scale TPCC/TPCE/TPCH Workloads.C. Delimitrou, S. Sankar, B. Khessib, K. Vaid, and C. Kozyrakis. TPCTC, volume 7144 of Lecture Notes in Computer Science, page 146-162. Springer, (2011)Heterogeneous-Reliability Memory: Exploiting Application-Level Memory Error Tolerance.Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. CoRR, (2016)SSD Failures in Datacenters: What? When? and Why?I. Narayanan, D. Wang, M. Jeon, B. Sharma, L. Caulfield, A. Sivasubramaniam, B. Cutler, J. Liu, B. Khessib, and K. Vaid. SYSTOR, page 7:1-7:11. ACM, (2016)

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Disambiguation of "Khessib, Badriddine"

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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

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Disambiguation of "Khessib, Badriddine"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.