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On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories.

, , , , and . DATE, page 580-585. IEEE Computer Society, (2005)

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Evaluating the Data Integrity of Memory Systems by Configurable Markov Models., , , , and . ISVLSI, page 257-259. IEEE Computer Society, (2005)Evaluation of Error-Resilience for Reliable Compression of Test Data., , and . DATE, page 1284-1289. IEEE Computer Society, (2005)A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment., , , , , , , , , and . DFT, page 159-166. IEEE Computer Society, (2003)Enhancing error resilience for reliable compression of VLSI test data., , and . ACM Great Lakes Symposium on VLSI, page 371-376. ACM, (2005)On the Test and Diagnosis of the Perfect Shuffle., and . DFT, page 97-104. IEEE Computer Society, (2003)Scan Test of IP Cores in an ATE Environment., , and . DELTA, page 281-286. IEEE Computer Society, (2004)On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories., , , , and . DATE, page 580-585. IEEE Computer Society, (2005)Markov Models of Fault-Tolerant Memory Systems under SEU., , and . MTDT, page 38-43. IEEE Computer Society, (2004)Design and Implementation of a Self-Checking Scheme for Railway Trackside Systems., , and . MTDT, page 49-56. IEEE Computer Society, (2002)Self-checking design, implementation, and measurement of a controller for track-side railway systems., , and . IEEE Trans. Instrumentation and Measurement, 52 (6): 1722-1728 (2003)