( en | de | ru )

 

Disambiguation of "Hsiao, Michael S."

Author of the publication

copydeleteadd this publication to your clipboard
A SMT-based diagnostic test generation method for combinational circuits.

, , , and . VTS, page 215-220. IEEE Computer Society, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Chi-Yuan Hsiao

Lojen Hsiao

Kaijen Hsiao

He-Hsuan Hsiao

Michael Kai Mikai Hsiao

 

Other publications of authors with the same name

A SMT-based diagnostic test generation method for combinational circuits., , , and . VTS, page 215-220. IEEE Computer Society, (2012)Set-cover-based critical implications selection to improvesat-based bounded model checking: extended abstract., , and . ACM Great Lakes Symposium on VLSI, page 331-332. ACM, (2013)GPU-based timing-aware test generation for small delay defects., , , , , and . ETS, page 1-2. IEEE, (2014)A novel concurrent cache-friendly binary decision diagram construction for multi-core platforms., , and . DATE, page 1427-1430. EDA Consortium San Jose, CA, USA / ACM DL, (2013)A new hybrid solution to boost SAT solver performance., and . DATE, page 1307-1313. EDA Consortium, San Jose, CA, USA, (2007)Peak power estimation of VLSI circuits: new peak power measures., , and . IEEE Trans. Very Large Scale Integr. Syst., 8 (4): 435-439 (2000)Error Diagnosis of Sequential Circuits Using Region-Based Model., and . J. Electron. Test., 21 (2): 115-126 (2005)On Non-Statistical Techniques for Fast Fault Coverage Estimation.. J. Electron. Test., 15 (3): 239-254 (1999)Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors., , , and . J. Electron. Test., 19 (4): 437-445 (2003)RTL functional test generation using factored concolic execution., and . ITC, page 1-10. IEEE, (2017)