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Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.

, , , , , and . Asian Test Symposium, page 214-219. IEEE Computer Society, (2012)

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Scan Chain Organization for Embedded Diagnosis., and . DATE, page 468-473. ACM, (2008)Accurate X-Propagation for Test Applications by SAT-Based Reasoning., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (12): 1908-1919 (2012)On Determining the Real Output Xs by SAT-Based Reasoning., , and . Asian Test Symposium, page 39-44. IEEE Computer Society, (2010)BISD: Scan-based Built-In self-diagnosis., and . DATE, page 1243-1248. IEEE Computer Society, (2010)Scan chain clustering for test power reduction., , , , , and . DAC, page 828-833. ACM, (2008)