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Другие публикации лиц с тем же именем

Scan Chain Organization for Embedded Diagnosis., и . DATE, стр. 468-473. ACM, (2008)Accurate X-Propagation for Test Applications by SAT-Based Reasoning., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (12): 1908-1919 (2012)On Determining the Real Output Xs by SAT-Based Reasoning., , и . Asian Test Symposium, стр. 39-44. IEEE Computer Society, (2010)BISD: Scan-based Built-In self-diagnosis., и . DATE, стр. 1243-1248. IEEE Computer Society, (2010)Scan chain clustering for test power reduction., , , , , и . DAC, стр. 828-833. ACM, (2008)