( en | de | ru )

 

Disambiguation of "Jr., John M. Carulli"

Author of the publication

copydeleteadd this publication to your clipboard
Variation and failure characterization through pattern classification of test data from multiple test stages.

, , , , , , and . ITC, page 1-10. IEEE, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

John M Sullivan

John M MacMahon

Foued Jrad

Robert Jr Cramer

Jr-Hung Lin

 

Other publications of authors with the same name

Variation and failure characterization through pattern classification of test data from multiple test stages., , , , , , and . ITC, page 1-10. IEEE, (2016)IC laser trimming speed-up through wafer-level spatial correlation modeling., , , , , , and . ITC, page 1-7. IEEE Computer Society, (2014)Spatial correlation modeling for probe test cost reduction in RF devices., , , and . ICCAD, page 23-29. ACM, (2012)Parametric counterfeit IC detection via Support Vector Machines., , and . DFT, page 7-12. IEEE Computer Society, (2012)Predicting die-level process variations from wafer test data for analog devices: A feasibility study., , , , , and . LATW, page 1-6. IEEE Computer Society, (2013)Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests., , , and . DATE, page 553-558. EDA Consortium San Jose, CA, USA / ACM DL, (2013)A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits., , , , , and . DATE, page 1042-1047. ACM, (2015)Quality improvement and cost reduction using statistical outlier methods., , , and . ICCD, page 64-69. IEEE Computer Society, (2009)On combining alternate test with spatial correlation modeling in analog/RF ICs., , , and . ETS, page 1-6. IEEE Computer Society, (2013)Die-level adaptive test: Real-time test reordering and elimination., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)