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Optimization of the temporal response of II-VI direct type semiconductor detectors for flat-panel pulsed X-ray imaging., , , , , , , , , and 5 other author(s). IEEE Trans. Instrum. Meas., 50 (6): 1610-1614 (2001)Timing characteristics of a Cd1-xZnxTe detector-based X-ray imaging system., , , , , , , , , and 1 other author(s). IEEE Trans. Instrum. Meas., 48 (5): 909-914 (1999)Intrinsic sensitivity of Cd1-xZnxTe semiconductors for digital radiographic imaging., , , , , , , , , and 5 other author(s). IEEE Trans. Instrum. Meas., 52 (5): 1559-1565 (2003)Detective quantum efficiency DQE(0) of CZT semiconductor detectors for digital radiography., , , , , , , , , and 3 other author(s). IEEE Trans. Instrum. Meas., 53 (6): 1479-1484 (2004)Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography., , , , , , , , , and 5 other author(s). IEEE Trans. Instrum. Meas., 50 (6): 1604-1609 (2001)An efficient, novel microstrip collector architecture for digital radiographic imaging CZT semiconductor sensors., , , , , , , , , and . IEEE Trans. Instrum. Meas., 54 (3): 1144-1149 (2005)