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A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead.

H. Zhang, W. He, Y. Sun, и M. Seok. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (3): 1015-1028 (марта 2023)

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Weifeng Song

Weifeng Shi

Weifeng Shang

Hongxia He

Ning He

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