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Minimal March Tests for Detection of Dynamic Faults in Random Access Memories.

, , и . J. Electron. Test., 23 (1): 55-74 (2007)

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Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories., , и . DDECS, стр. 262-267. IEEE Computer Society, (2006)Minimal March Tests for Detection of Dynamic Faults in Random Access Memories., , и . J. Electron. Test., 23 (1): 55-74 (2007)An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories., , и . VTS, стр. 95-100. IEEE Computer Society, (2008)Symmetry Measure for Memory Test and Its Application in BIST Optimization., , , , и . J. Electron. Test., 27 (6): 753-766 (2011)A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories., , и . DDECS, стр. 145-148. IEEE Computer Society, (2007)An effective embedded test & diagnosis solution for external memories., и . IOLTS, стр. 168-170. IEEE, (2015)Minimal March Tests for Dynamic Faults in Random Access Memories., , и . ETS, стр. 43-48. IEEE Computer Society, (2006)Generic BIST architecture for testing of content addressable memories., , , , и . IOLTS, стр. 86-91. IEEE Computer Society, (2011)Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories., , и . VTS, стр. 120-127. IEEE Computer Society, (2006)Minimal March Tests for Unlinked Static Faults in Random Access Memories., , и . VTS, стр. 53-59. IEEE Computer Society, (2005)