Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Delay Estimates for Graphene Nanoribbons: A Novel Measure of Fidelity and Experiments with Global Routing Trees.

S. Das, S. Das, A. Majumder, P. Dasgupta, and D. Das. ACM Great Lakes Symposium on VLSI, page 263-268. ACM, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Atanu Kumar Das

Manmatha Kumar Das

Paritosh Kumar Das Gupta

Tapan Kumar Das Gupta

Romy Das

Bio-economic modeling of soil resource conservation in Mid Hill Region of NepalR. Das. Uni Gießen, (2009)

Other publications of authors with the same name

Delay Estimates for Graphene Nanoribbons: A Novel Measure of Fidelity and Experiments with Global Routing Trees.S. Das, S. Das, A. Majumder, P. Dasgupta, and D. Das. ACM Great Lakes Symposium on VLSI, page 263-268. ACM, (2016)Minimization of Switching Activity of Graphene Based Circuits.S. Das, P. Fiser, S. Pandit, and D. Das. VLSID, page 139-144. IEEE, (2021)Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity.D. Das, T. Inoue, S. Chakraborty, and H. Fujiwara. Asian Test Symposium, page 342-347. IEEE Computer Society, (2004)A new ALU architecture design using reversible logic.A. Banerjee, and D. Das. ISED, page 187-191. IEEE, (2016)A technique to construct global routing trees for graphene nanoribbon (GNR).S. Das, and D. Das. ISQED, page 111-118. IEEE, (2017)Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs.T. Kaibartta, G. Biswas, and D. Das. J. Electron. Test., 36 (2): 239-253 (2020)Genetic Algorithm Based Efficient Grouping Technique for Post Bond Test and Crosstalk Faults Among TSVs.T. Kaibartta, H. Arora, and D. Das. VLSID, page 730-735. IEEE, (2024)A Novel ALU Circuit based on Reversible Logic.A. Banerjee, and D. Das. J. Circuits Syst. Comput., 29 (11): 2050172:1-2050172:17 (2020)Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits.J. Mondal, B. Mondal, D. Kole, H. Rahaman, and D. Das. Journal of Circuits, Systems, and Computers, 28 (12): 1950212:1-1950212:18 (2019)On Designing Testable Reversible Circuits Using Gate Duplication.J. Mondal, D. Das, D. Kole, H. Rahaman, and B. Bhattacharya. VDAT, volume 382 of Communications in Computer and Information Science, page 322-329. Springer, (2013)

BibSonomy

Disambiguation of "Das, Debesh Kumar"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Delay Estimates for Graphene Nanoribbons: A Novel Measure of Fidelity and Experiments with Global Routing Trees.

Please choose a person to relate this publication to

Atanu Kumar Das

Manmatha Kumar Das

Paritosh Kumar Das Gupta

Tapan Kumar Das Gupta

Romy Das

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Das, Debesh Kumar"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Delay Estimates for Graphene Nanoribbons: A Novel Measure of Fidelity and Experiments with Global Routing Trees.

Please choose a person to relate this publication to

Atanu Kumar Das

Manmatha Kumar Das

Paritosh Kumar Das Gupta

Tapan Kumar Das Gupta

Romy Das

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Delay Estimates for Graphene Nanoribbons: A Novel Measure of Fidelity and Experiments with Global Routing Trees.