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Disambiguation of "Sugawa, Shigetoshi"

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A prototype high-speed CMOS image sensor with 10, 000, 000 fps burst-frame rate and 10, 000 fps continuous-frame rate.

, , , , , and . Digital Photography, volume 7876 of SPIE Proceedings, page 78760G. SPIE/IS&T, (2011)

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Michiru Sugawa

 

Other publications of authors with the same name

A robust color signal processing with wide dynamic range WRGB CMOS image sensor., , and . Digital Photography, volume 7876 of SPIE Proceedings, page 78760W. SPIE/IS&T, (2011)A Rapid Prototyping of Real-Time Pattern Generator for Step-and-Scan Lithography Using Digital Micromirror Device., , , , , and . FPT, page 305-308. IEEE, (2007)High Speed and Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems., , , , , , , , , and . IEICE Trans. Electron., 101-C (11): 897-900 (2018)A still image encoder based on adaptive resolution vector quantization employing needless calculation elimination architecture., , , , , , and . ASP-DAC, page 567-568. ACM, (2003)High Sensitivity and High Readout Speed Electron Beam Detector using Steep pn Junction Si diode for Low Acceleration Voltage., , , , and . IMSE, page 14-17. Society for Imaging Science and Technology, (2017)A Preliminary Chip Evaluation toward Over 50Mfps Burst Global Shutter Stacked CMOS Image Sensor., , , and . IMSE, page 1-4. Society for Imaging Science and Technology, (2018)Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation., , , , , , and . IRPS, page 4-1. IEEE, (2018)Checkered white-RGB color LOFIC CMOS image sensor., , , and . ASP-DAC, page 347-348. IEEE, (2010)Circuit level prediction of device performance degradation due to negative bias temperature stress., , , , , , and . Microelectron. Reliab., 47 (6): 930-936 (2007)Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction., , , , and . Microelectron. Reliab., 47 (2-3): 409-418 (2007)