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Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation.

C. Peng, Z. Hu, Z. Zhang, H. Huang, B. Ning, and D. Bi. Microelectron. Reliab., 54 (4): 730-737 (2014)

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Zhiyuan Zhu

Zhiyuan Luo

Zhiyuan Zhang

Zhiyuan Sui

Zhiyuan Zhan

Other publications of authors with the same name

A comprehensive security architecture for SDN.Z. Hu, M. Wang, X. Yan, Y. Yin, and Z. Luo. ICIN, page 30-37. IEEE, (2015)A framework for security on demand.Z. Hu, and Y. Yin. IWCMC, page 378-383. IEEE, (2017)Impact of within-wafer process variability on radiation response.Z. Hu, Z. Liu, H. Shao, Z. Zhang, B. Ning, M. Chen, D. Bi, and S. Zou. Microelectron. J., 42 (6): 883-888 (2011)Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology.L. Song, Z. Hu, M. Zhang, X. Liu, L. Dai, Z. Zhang, and S. Zou. Microelectron. Reliab., (2017)Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.L. Dai, X. Liu, M. Zhang, L. Zhang, Z. Hu, D. Bi, Z. Zhang, and S. Zou. Microelectron. Reliab., (2017)A highly stable and low-cost 12T radiation hardened SRAM cell design for aerospace application.Z. Liu, Y. Xie, T. Xu, Q. Liu, D. Bi, Z. Hu, S. Zou, and Z. Zhang. Int. J. Circuit Theory Appl., 51 (8): 3938-3948 (August 2023)An Experimental Study of Relationship Between Stress and Excitation Magnetic Field.H. Li, C. Zhao, F. Zhang, Z. Hu, and L. Ding. IEEE Trans. Instrum. Meas., (2023)Scenario-oriented repetitive project scheduling optimization.Z. Hu, F. Wang, and Y. Tang. Comput. Aided Civ. Infrastructure Eng., 38 (10): 1239-1273 (2023)PoetryDiffusion: Towards Joint Semantic and Metrical Manipulation in Poetry Generation.Z. Hu, C. Liu, Y. Feng, and B. Hooi. CoRR, (2023)READ-PVLA: Recurrent Adapter with Partial Video-Language Alignment for Parameter-Efficient Transfer Learning in Low-Resource Video-Language Modeling.T. Nguyen, X. Wu, X. Dong, K. Le, Z. Hu, C. Nguyen, S. Ng, and L. Tuan. CoRR, (2023)

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Disambiguation of "Hu, Zhiyuan"

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Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation.

Please choose a person to relate this publication to

Zhiyuan Zhu

Zhiyuan Luo

Zhiyuan Zhang

Zhiyuan Sui

Zhiyuan Zhan

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Hu, Zhiyuan"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation.

Please choose a person to relate this publication to

Zhiyuan Zhu

Zhiyuan Luo

Zhiyuan Zhang

Zhiyuan Sui

Zhiyuan Zhan

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation.