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Supercapacitors aging diagnosis using least square algorithm., , , , , , and . Microelectron. Reliab., 53 (9-11): 1638-1642 (2013)Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour., , , , , , and . Microelectron. Reliab., 51 (9-11): 2010-2014 (2011)Supercapacitor ageing at constant temperature and constant voltage and thermal shock., , , , , , and . Microelectron. Reliab., 50 (9-11): 1783-1788 (2010)Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature., , , , , and . Microelectron. Reliab., 50 (9-11): 1810-1814 (2010)Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress., , , and . Microelectron. Reliab., 44 (9-11): 1461-1465 (2004)Calendar and cycling ageing of activated carbon supercapacitor for automotive application., , , , , and . Microelectron. Reliab., 52 (9-10): 2477-2481 (2012)Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET., , , , and . Microelectron. Reliab., 55 (9-10): 1512-1516 (2015)Trench insulated gate bipolar transistors submitted to high temperature bias stress., , , and . Microelectron. Reliab., 45 (9-11): 1728-1731 (2005)Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating., , , , , , and . Microelectron. Reliab., 41 (9-10): 1325-1329 (2001)Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition., , , , , , and . Microelectron. Reliab., 51 (2): 386-391 (2011)