( en | de | ru )

 

Disambiguation of "Okamoto, Toshiyuki"

Author of the publication

copydeleteadd this publication to your clipboard
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment.

, , , , , , , , , , , , and . ATS, page 139-140. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Hideakira Okamoto

Toshiyuki Ichiba

Takashi Okamoto

Toshiyuki Ishikawa

 

Other publications of authors with the same name

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers., , , , , , , , , and 5 other author(s). ATS, page 1-6. IEEE, (2020)Evaluation of Null Method for Operational Amplifier Short-Time Testing., , , , , , , , , and 3 other author(s). ASICON, page 1-4. IEEE, (2019)Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production., , , , , , , , , and 3 other author(s). ICECS, page 1-6. IEEE, (2021)Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method., , , , , , , , , and 4 other author(s). IOLTS, page 1-6. IEEE, (2021)A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation., , , , , , , , , and 3 other author(s). ITC-Asia, page 1-6. IEEE, (2023)Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies., , , , , , , , , and 2 other author(s). ITC, page 284-288. IEEE, (2021)Accurate Testing of Precision Voltage Reference by DC-AC Conversion., , , , , , , and . ATS, page 1-2. IEEE, (2020)Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing., , , , , , , , , and 3 other author(s). IEICE Electron. Express, 20 (1): 20220470 (2023)Innovative Test Practices in Japan., , , , , , , , , and 4 other author(s). VTS, page 1. IEEE, (2019)High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST., , , , , , , , , and 3 other author(s). ATS, page 37-42. IEEE, (2022)