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Disambiguation of "Couet, Sebastien"

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NPN Si/SiGe memory selector with non-linearity>105 and ON-current>6MA/cm2.

, , , , , , , , , , , and . ESSDERC, page 164-167. IEEE, (2023)

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Sébastien Couet

Julien Couet

Adrien Couëtoux

Heinz Gert Couet

Heinz-Gert Couet

 

Other publications of authors with the same name

Spin-orbit torque MRAM for ultrafast cache and neuromorphic computing applications., , , , , , , , and . IMW, page 1-4. IEEE, (2023)Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors., , , , , , , , , and 1 other author(s). IRPS, page 10-1. IEEE, (2022)Solid state qubits: how learning from CMOS fabrication can speed-up progress in Quantum Computing., , , , , , , , , and 19 other author(s). VLSI Circuits, page 1-2. IEEE, (2021)Challenges and targets of MRAM-enabled scaled spintronic logic circuits., , , , , , , , , and 1 other author(s). CoRR, (2022)Spintronic logic: from transducers to logic gates and circuits., , , , and . CoRR, (2024)MTJ degradation in multi-pillar SOT-MRAM with selective writing., , , , , , , , and . IRPS, page 1-7. IEEE, (2023)Device Aware Diagnosis for Unique Defects in STT-MRAMs., , , , , , , , and . ATS, page 1-6. IEEE, (2023)MTJ degradation in SOT-MRAM by self-heating-induced diffusion., , , , , , , and . IRPS, page 4. IEEE, (2022)Device-Aware Test for Back-Hopping Defects in STT-MRAMs., , , , , , , , and . DATE, page 1-6. IEEE, (2023)Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2021)