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Electrical analysis on implantation-related defect by nanoprobing methodology.

C. Chen, P. Ng, G. Ang, H. Tan, F. Rivai, Y. Ma, H. Ng, J. Lam, and Z. Mai. Microelectron. Reliab., (2016)

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Changqing Chen

Changqing Zhao

Qi Changqing

Changqing Qi

Chen Chen

Other publications of authors with the same name

The C-ND tree: a multidimensional index for hybrid continuous and non-ordered discrete data spaces.C. Chen, S. Pramanik, Q. Zhu, A. Watve, and G. Qian. EDBT, volume 360 of ACM International Conference Proceeding Series, page 462-471. ACM, (2009)Two-dimensional modeling of the self-limiting oxidation in silicon and tungsten nanowiresM. Liu;, P. Jin;, Z. Xu;, D. Hanaor;, Y. Gan;, and C. Chen. Theoretical and Applied Mechanics Letters, 6 (5): 195-199 (2016)Electrical analysis on implantation-related defect by nanoprobing methodology.C. Chen, P. Ng, G. Ang, H. Tan, F. Rivai, Y. Ma, H. Ng, J. Lam, and Z. Mai. Microelectron. Reliab., (2016)View Merging in the Context of View Selection.C. Chen, Y. Feng, and J. Feng. IDEAS, page 33-43. IEEE Computer Society, (2002)An improved semi-analytical solution for stress at round-tip notchesM. Liu, Y. Gan, D. Hanaor, B. Liu, and C. Chen. Engineering fracture mechanics, (2015)Manifold Adaptive Label Propagation for Face Clustering.X. Pei, Z. Lyu, C. Chen, and C. Chen. IEEE Trans. Cybern., 45 (8): 1681-1691 (2015)Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.C. Chen, G. Ang, P. Ng, F. Rivai, S. Neo, D. Nagalingam, K. Yip, J. Lam, and Z. Mai. Microelectron. Reliab., (2017)Ultra-short term wind power prediction based on quadratic variational mode decomposition and multi-model fusion of deep learning.C. Chen, S. Li, M. Wen, and Z. Yu. Comput. Electr. Eng., (2024)Virtual Label Constraint Nonnegative Matrix Factorization.X. Pei, C. Chen, and W. Gong. FSKD, page 460-464. IEEE, (2015)Conducted Electromagnetic Interference Modeling for Motor Drives Based on Port Impedance Measurement.C. Chen, T. Hu, L. Yang, Z. Zheng, and Q. Zhang. IECON, page 1-9. IEEE, (2023)

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Disambiguation of "Chen, Changqing"

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Electrical analysis on implantation-related defect by nanoprobing methodology.

Please choose a person to relate this publication to

Changqing Chen

Changqing Zhao

Qi Changqing

Changqing Qi

Chen Chen

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chen, Changqing"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Electrical analysis on implantation-related defect by nanoprobing methodology.

Please choose a person to relate this publication to

Changqing Chen

Changqing Zhao

Qi Changqing

Changqing Qi

Chen Chen

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
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Chicago
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Electrical analysis on implantation-related defect by nanoprobing methodology.