Author of the publication

2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT Architectures.

, , , , , and . ISVLSI, page 386-391. IEEE Computer Society, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Secure PUF-based Authentication and Key Exchange Protocol using Machine Learning., , , , and . ISVLSI, page 386-389. IEEE, (2022)A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable Functions., , , , and . IOLTS, page 1-7. IEEE, (2023)Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure., , , , and . ITC, page 539-543. IEEE, (2022)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , and . Microprocess. Microsystems, (2017)Nonlinear Codes for Control Flow Checking., and . ETS, page 1-6. IEEE, (2020)PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community., , , , , , , and . ETS, page 1-10. IEEE, (2020)Experimentations on scan chain encryption with PRESENT., , , and . IVSW, page 45-50. IEEE, (2017)