Author of the publication

Faults in Processor Control Subsystems: Testing Correctness and Performance Faults in the Data Prefetching Unit.

, , and . Asian Test Symposium, page 319-324. IEEE Computer Society, (2001)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths., and . DAC, page 813-818. ACM Press, (1996)Squeezing Correlated Neurons for Resource-Efficient Deep Neural Networks., and . ECML/PKDD (2), volume 12458 of Lecture Notes in Computer Science, page 52-68. Springer, (2020)Compacting Test Responses for Deeply Embedded SoC Cores., and . IEEE Des. Test Comput., 20 (4): 22-30 (2003)Software Design Issues in the Implementation of Hierarchical, Display Editors. University of Illinois Urbana-Champaign, USA, (1983)Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (7): 1101-1105 (2009)High durability in NAND flash memory through effective page reuse mechanisms., and . CODES+ISSS, page 205-212. ACM, (2010)Application specific non-volatile primary memory for embedded systems., and . CODES+ISSS, page 31-36. ACM, (2008)Performance and energy efficient cache migrationapproach for thermal management in embedded systems., and . ACM Great Lakes Symposium on VLSI, page 365-368. ACM, (2010)Energy-effcient physically tagged caches for embedded processors with virtual memory., , and . DAC, page 17-22. ACM, (2005)A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs., and . DAC, page 851-856. ACM, (2005)