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Efficient Selection of Trace and Scan Signals for Post-Silicon Debug.

, , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 313-323 (2016)

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Efficient Selection of Trace and Scan Signals for Post-Silicon Debug., , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 313-323 (2016)Directed test generation for hybrid systems., and . ISQED, page 156-162. IEEE, (2014)Test Generation for Hybrid Systems Using Clustering and Learning Techniques., and . VLSID, page 589-590. IEEE Computer Society, (2016)