( en | de | ru )

 

Disambiguation of "Yin, Boxue"

Author of the publication

copydeleteadd this publication to your clipboard
Scan chain configuration based X-filling for low power and high quality testing.

, , , and . IET Comput. Digit. Tech., 4 (1): 1-13 (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Li Yin

Zhihong Yin

Renfu Yin

Lu Yin

Yi Yin

 

Other publications of authors with the same name

Conflict driven scan chain configuration for high transition fault coverage and low test power., , and . ASP-DAC, page 666-671. IEEE, (2009)OceanBase: A 707 Million tpmC Distributed Relational Database System., , , , , , , , , and 6 other author(s). Proc. VLDB Endow., 15 (12): 3385-3397 (2022)New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets., , and . VLSI Design, page 221-226. IEEE Computer Society, (2009)Compact Test Generation for Small-Delay Defects Using Testable-Path Information., , and . Asian Test Symposium, page 424-429. IEEE Computer Society, (2009)Leveraging Page-Level Compression in MySQL - A Practice at Baidu., , , , , , , and . Trustcom/BigDataSE/ISPA, page 1085-1092. IEEE, (2016)The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost., , and . VTS, page 146-151. IEEE Computer Society, (2009)Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure., , and . VTS, page 251-256. IEEE Computer Society, (2009)Scan chain configuration based X-filling for low power and high quality testing., , , and . IET Comput. Digit. Tech., 4 (1): 1-13 (2010)A power-effective scan architecture using scan flip-flops clustering and post-generation filling., , and . ACM Great Lakes Symposium on VLSI, page 517-522. ACM, (2009)Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (9): 1968-1979 (2014)