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Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategy.

, , , and . LATW, page 1-6. IEEE Computer Society, (2012)

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Digital test of ZigBee transmitters: Validation in industrial test environment., , , and . DATE, page 396-401. IEEE, (2021)Minimizing the Hardware Overhead of a Histogram-Based BIST Scheme for Analog-to-Digital Converters., , , and . LATW, page 118-122. IEEE, (2000)Making predictive analog/RF alternate test strategy independent of training set size., , , , , , and . ITC, page 1-9. IEEE Computer Society, (2012)A design-for-test technique for multistage analog circuits., , and . Asian Test Symposium, page 113-119. IEEE Computer Society, (1995)The multi-configuration: A DFT technique for analog circuits., , and . VTS, page 54-59. IEEE Computer Society, (1996)A multi-converter DFT technique for complex SIP: Concepts and validation., , , , , and . ECCTD, page 747-750. IEEE, (2009)Analysis and Attenuation Proposal in Ground Bounce., , , and . Asian Test Symposium, page 460-463. IEEE Computer Society, (2004)European Network for Test Education., , , , , and . DELTA, page 230-234. IEEE Computer Society, (2002)On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor., , , and . VTS, page 213-218. IEEE Computer Society, (2005)Änalogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC., , , , , and . ETS, page 211-216. IEEE Computer Society, (2007)