( en | de | ru )

 

Disambiguation of "Patel, Janak H."

Author of the publication

copydeleteadd this publication to your clipboard
Partial Scan Selection Based on Dynamic Reachability and Observability Information.

, , , and . VLSI Design, page 174-180. IEEE Computer Society, (1998)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Janak Prasad

Angel Janakieff

Wassil Janakiew

Narayanan Janakiraman

Nikolai Janakiev

 

Other publications of authors with the same name

Parallel Garbage Collection on a Virtual Memory System., and . ICPP, page 243-246. Pennsylvania State University Press, (1987)The evolution of dependable computing at the University of Illinois., , , and . IFIP Congress Topical Sessions, volume 156 of IFIP, page 135-164. Kluwer/Springer, (2004)Analysis of Multiprocessors with Private Cache Memories.. IEEE Trans. Computers, 31 (4): 296-304 (1982)Performance of Processor-Memory Interconnections for Multiprocessors.. IEEE Trans. Computers, 30 (10): 771-780 (1981)Design of Test Pattern Generators for Built-In Test., , and . ITC, page 315-319. IEEE Computer Society, (1984)Parallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors., , and . DAC, page 155-159. ACM, (1991)ProperHITEC: A Portable, Parallel, Object-Oriented Approach to Sequential Test Generation., , and . DAC, page 717-721. ACM Press, (1994)Compiler Directed Memory Management Policy For Numerical Programs., and . SOSP, page 97-106. ACM, (1985)Operating System Review 19(5).Design and Algorithms for Parallel Testing of Random Access and Content Addressable Memories., , and . DAC, page 689-694. IEEE Computer Society Press / ACM, (1987)A Functional-Level Test Generation Methodology Using Two-level Representations., and . DAC, page 722-725. ACM Press, (1989)