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Current ratios: a self-scaling technique for production IDDQ testing.

, , , , , , and . ITC, page 1148-1156. IEEE Computer Society, (2000)

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Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation., , , , and . ITC, page 683-692. IEEE Computer Society, (2002)Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process., and . ITC, page 802-808. IEEE Computer Society, (1997)Current ratios: a self-scaling technique for production I_DDQ testing., , , , , , and . ITC, page 738-746. IEEE Computer Society, (1999)Critical roles of RF and microwave electromagnetic field solver simulators in multi-gigabit high-speed digital applications., , and . ITC, page 1-9. IEEE Computer Society, (2007)Elucidating the structure of genetic regulatory networks: a study of a second order dynamical model on artificial data., and . ESANN, page 569-574. (2006)Current ratios: a self-scaling technique for production IDDQ testing., , , , , , and . ITC, page 1148-1156. IEEE Computer Society, (2000)Characterization and optimization of the production probing process., , and . ITC, page 378-387. IEEE Computer Society, (1999)CurrentClean: Interactive Change Exploration and Cleaning of Stale Data., , , , and . CIKM, page 2917-2920. ACM, (2019)Exploring Hierarchical Multi-Label Text Classification Models using Attention-Based Approaches for Vietnamese language., , , and . NLPIR, page 38-43. ACM, (2023)Cross-layer framework for interference avoidance in cognitive radio ad-hoc networks. (Un cadre inter-couches pour la protection contre les interférences dans les réseaux ad-hoc radio cognitive).. University of Bordeaux, France, (2015)