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On the optimal reconfiguration times for TMR circuits on SRAM based FPGAs., и . AHS, стр. 9-14. IEEE, (2013)Programmable SEL Test Monitoring System for Radiation Hardness Assurance., , , , , , и . DSN-S, стр. 217-223. IEEE, (2023)Design Techniques for Multi-Core Neural Network Accelerators on Radiation-Hardened FPGAs., , и . ISPDC, стр. 16-22. IEEE, (2023)Enhanced Video Surveillance Systems for "Signal for Help" Detection on Edge Devices., , и . ISTAS, стр. 1-4. IEEE, (2023)Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections., , , , , , , , , и . DATE, стр. 1-6. IEEE, (2023)Validation and robustness assessment of an automotive system., , , , , и . IDT, стр. 1-6. IEEE, (2013)Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks., , , и . CoRR, (2020)RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems., , , , , , , , , и 8 other автор(ы). CoRR, (2019)On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques., , , , и . CoRR, (2020)Reliability Analysis of Microarchitectural Faults in GPGPU-based HPC Systems., , и . CF, стр. 213-214. ACM, (2023)