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Disambiguation of "Daasch, W. Robert"

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Application of non-parametric statistics of the parametric response for defect diagnosis.

, , , and . ITC, page 1-10. IEEE Computer Society, (2009)

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Thea Daasch

Traugott Daasch

Robert W Jahn

Robert W Kuipers

Robert C W Wawrzinek

 

Other publications of authors with the same name

Multidimensional Test Escape Rate Modeling., , , , and . IEEE Des. Test Comput., 26 (5): 74-82 (2009)Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers., , , and . IEEE Des. Test Comput., 23 (2): 100-109 (2006)Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs., , and . IEEE Des. Test Comput., 20 (5): 46-53 (2003)Statistics in Semiconductor Test: Going beyond Yield., , and . IEEE Des. Test Comput., 26 (5): 64-73 (2009)Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data., , , and . ITC, page 1240. IEEE Computer Society, (2002)Die-level adaptive test: Real-time test reordering and elimination., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort., , , and . IEEE Des. Test Comput., 19 (5): 74-81 (2002)High Speed Interconnection Using the Clos Network., , and . ICS, volume 297 of Lecture Notes in Computer Science, page 96-111. Springer, (1987)TEM2P2EST: A Thermal Enabled Multi-model Power/Performance ESTimator., , , and . PACS, volume 2008 of Lecture Notes in Computer Science, page 112-125. Springer, (2000)Screening MinVDD Outliers Using Feed-Forward Voltage Testing., , , , , , , and . ITC, page 673-682. IEEE Computer Society, (2002)