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Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.

Y. Liang, Y. Zhang, Y. Cai, Z. Wang, Y. Zhao, H. Wen, and W. Liu. ICICDT, page 1-4. IEEE, (2021)

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Huiqing Xu

Huiqing Li

Wen Peng

Ming Wen

Other publications of authors with the same name

Internal Voltage Phase-Amplitude Dynamic Analysis With Interface Friendly Back-To-Back Power Converter Average Model for Less Power Electronics-Based More-Electric Ship.K. Ni, Y. Hu, R. Liang, H. Wen, and M. Alkahtani. IEEE Access, (2019)Reliable Winding-Based DC-Bus Capacitor Discharge Technique Over Full-Speed Range for IPMSM Drive in Electric Vehicles Without Position Sensor.C. Gong, Y. Hu, H. Wen, G. Chen, W. Li, and J. Gao. IEEE Trans. Ind. Electron., 67 (10): 8131-8142 (2020)An Improved Photovoltaic Power Reserve Control With Rapid Real-Time Available Power Estimation and Drift Avoidance.Y. Zhu, H. Wen, Q. Bu, X. Wang, Y. Hu, and G. Chen. IEEE Trans. Ind. Electron., 70 (11): 11287-11298 (November 2023)Forecasting-Based Power Ramp-Rate Control Strategies for Utility-Scale PV Systems.X. Chen, Y. Du, H. Wen, L. Jiang, and W. Xiao. IEEE Trans. Ind. Electron., 66 (3): 1862-1871 (2019)The Investigation of Source Field Plate on the Performance of pGaN Gate Device and Dual-Gate Bidirectional Switch using TCAD Simulation.X. Chi, Y. Wang, F. Li, Y. Huang, C. Yu, S. Wu, H. Wen, J. Gu, P. Zhang, and W. Liu. ICICDT, page 148-151. IEEE, (2023)Monolithic DFF-NAND and DFF-NOR logic circuits based on GaN MIS-HEMT.Y. Zhu, M. Cui, A. Li, F. Li, H. Wen, and W. Liu. ICICDT, page 1-4. IEEE, (2021)Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.Y. Liang, Y. Zhang, Y. Cai, Z. Wang, Y. Zhao, H. Wen, and W. Liu. ICICDT, page 1-4. IEEE, (2021)Stability Analysis of Monolithic GaN MIS-HEMT Comparator with Device PBTI and Circuit Stress Tests.A. Li, Y. Shen, Z. Li, Y. Zhu, H. Wen, and W. Liu. ASICON, page 1-3. IEEE, (2021)Monolithic GaN Half-Bridge Stages With Integrated Gate Drivers for High Temperature DC-DC Buck Converters.M. Cui, R. Sun, Q. Bu, W. Liu, H. Wen, A. Li, Y. Liang, and C. Zhao. IEEE Access, (2019)DC Offset Rejection Improvement in Single-Phase SOGI-PLL Algorithms: Methods Review and Experimental Evaluation.M. Xie, H. Wen, C. Zhu, and Y. Yang. IEEE Access, (2017)

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Disambiguation of "Wen, Huiqing"

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Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.

Please choose a person to relate this publication to

Huiqing Xu

Huiqing Li

Huiqing Li

Wen Peng

Ming Wen

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Huiqing"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.

Please choose a person to relate this publication to

Huiqing Xu

Huiqing Li

Huiqing Li

Wen Peng

Ming Wen

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.