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Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability., , , , , and . ESSDERC, page 234-237. IEEE, (2019)Reliability improvements in 50 nm MLC NAND flash memory using short voltage programming pulses., , , , and . Microelectron. Reliab., 49 (2): 135-138 (2009)Microscopic aspects of defect generation in SiO2., , and . Microelectron. Reliab., 42 (9-11): 1427-1432 (2002)Smart sensors for the recognition of specific human motion disorders in Parkinson's disease., , , , , , , , , and . IWASI, page 131-136. IEEE, (2015)Conductive filament evolution in HfO2 resistive RAM device during constant voltage stress., , and . Microelectron. Reliab., 55 (9-10): 1446-1449 (2015)Improving performance and reliability of NOR-Flash arrays by using pulsed operation., , and . Microelectron. Reliab., 46 (9-11): 1478-1481 (2006)Crested barrier in the tunnel stack of non-volatile memories., and . Microelectron. Reliab., 45 (5-6): 907-910 (2005)Threshold voltage instability in high-k based flash memories., and . Microelectron. Reliab., 50 (9-11): 1273-1277 (2010)Smart Sensing System for the Detection of Specific Human Motion Symptoms of the Parkinson's Disease., , , , , , , , and . BIODEVICES, page 152-159. SciTePress, (2016)Predicting Axial Impairment in Parkinson's Disease through a Single Inertial Sensor., , , , , and . Sensors, 22 (2): 412 (2022)