Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

In Design DFM Rule Scoring and Fixing Method using ICV.

V. Tripathi, Y. Li, Z. Lee, I. Tseng, J. Khaw, and J. Ong. CoRR, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Kilian Ong

Untersuchung von Schichtsystemen für kristallisierte Dünnschichtsiliziumsolarzellen auf GlasK. Ong. TU Hamburg, (2009)

Hoang Ong

Arlene Ong

Ratna Ong

Heidrun Ong

Other publications of authors with the same name

A System for Standard Cell Routability Checking and Placement Routability Improvements.I. Tseng, Z. Lee, V. Tripathi, C. Yip, Z. Chen, and J. Ong. APCCAS, page 125-128. IEEE, (2019)In Design DFM Rule Scoring and Fixing Method using ICV.V. Tripathi, Y. Li, Z. Lee, I. Tseng, J. Khaw, and J. Ong. CoRR, (2018)Utilizing a Telegram Quiz Bot to Promote Retrieval Practice.P. Mohan, J. Ong, F. Fung, J. Han, and J. Chew. TALE, page 1-5. IEEE, (2021)Context-Aware DFM Rule Analysis and Scoring Using Machine Learning.V. Tripathi, V. Perez, Y. Li, Z. Lee, I. Tseng, and J. Ong. CoRR, (2018)Toward a worker-centered analysis in fighting disinformation: global south perspectives on the political economy of 'fake news'.J. Ong. Interactions, 29 (2): 74-77 (2022)Multiple-Lithography-Compliant Verification for Standard Cell Library Development Flow.Y. Li, W. Ang, C. Lee, K. Chua, Y. Ong, and C. Hui. CoRR, (2018)Standard Cell Library Evaluation with Multiple lithography-compliant verification and Improved Synopsys Pin Access Checking Utility.Y. Li, W. Ang, C. Lee, K. Chua, Y. Ong, and C. Hui. CoRR, (2018)Prediction of Wafer Map Categories Using Wafer Acceptance Test Parameters in Semiconductor Manufacturing.M. Lim, A. Sharma, C. Chin, C. Yip, and J. Ong. AIAI (2), volume 647 of IFIP Advances in Information and Communication Technology, page 136-144. Springer, (2022)An Automated System for Checking Lithography Friendliness of Standard Cells.I. Tseng, Y. Li, V. Perez, V. Tripathi, Z. Lee, and Y. Ong. APCCAS, page 261-265. IEEE, (2018)Advanced In-Design Auto-Fixing Flow for Cell Abutment Pattern Matching Weakpoints.Y. Li, V. Perez, I. Tseng, Z. Lee, V. Tripathi, J. Khaw, and Y. Ong. CoRR, (2018)

BibSonomy

Disambiguation of "Ong, Jonathan"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

In Design DFM Rule Scoring and Fixing Method using ICV.

Please choose a person to relate this publication to

Kilian Ong

Hoang Ong

Arlene Ong

Ratna Ong

Heidrun Ong

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Ong, Jonathan"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML In Design DFM Rule Scoring and Fixing Method using ICV.

Please choose a person to relate this publication to

Kilian Ong

Hoang Ong

Arlene Ong

Ratna Ong

Heidrun Ong

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

In Design DFM Rule Scoring and Fixing Method using ICV.