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Two-dimensional impurity profiling with emission computed tomography techniques.

, , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 8 (4): 323-335 (1989)

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An evaluation of the impact of gate oxide tunneling on dual-Vt-based leakage reduction techniques., , and . ACM Great Lakes Symposium on VLSI, page 105-110. ACM, (2006)The spectral grid method: a novel fast Schrodinger-equation solver for semiconductor nanodevice simulation., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (8): 1200-1208 (2004)Two-dimensional impurity profiling with emission computed tomography techniques., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 8 (4): 323-335 (1989)Dual-threshold pass-transistor logic design., , and . ACM Great Lakes Symposium on VLSI, page 291-296. ACM, (2009)