( en | de | ru )

 

Disambiguation of "Gonugondla, Sujan K."

Author of the publication

copydeleteadd this publication to your clipboard
An In-Memory VLSI Architecture for Convolutional Neural Networks.

, , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 8 (3): 494-505 (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Sujan Rajbhandari

Mark-Alexander Sujan

Sujan Pandey

Aman K K Bhasin

K Schweizerhof

 

Other publications of authors with the same name

A 481pJ/decision 3.4M decision/s Multifunctional Deep In-memory Inference Processor using Standard 6T SRAM Array., , , and . CoRR, (2016)Fundamental Limits on Energy-Delay-Accuracy of In-Memory Architectures in Inference Applications., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3188-3201 (2022)An MRAM-Based Deep In-Memory Architecture for Deep Neural Networks., , , , and . ISCAS, page 1-5. IEEE, (2019)Fundamental Limits on the Precision of In-memory Architectures., , , and . ICCAD, page 128:1-128:9. IEEE, (2020)KeyRAM: A 0.34 uJ/decision 18 k decisions/s Recurrent Attention In-memory Processor for Keyword Spotting., , , and . CICC, page 1-4. IEEE, (2020)An In-Memory VLSI Architecture for Convolutional Neural Networks., , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 8 (3): 494-505 (2018)A 19.4 nJ/decision 364K decisions/s in-memory random forest classifier in 6T SRAM array., , and . ESSCIRC, page 263-266. IEEE, (2017)A Variation-Tolerant In-Memory Machine Learning Classifier via On-Chip Training., , and . IEEE J. Solid State Circuits, 53 (11): 3163-3173 (2018)An energy-efficient memory-based high-throughput VLSI architecture for convolutional networks., , , and . ICASSP, page 1037-1041. IEEE, (2015)Deep In-Memory Architectures in SRAM: An Analog Approach to Approximate Computing., , and . Proc. IEEE, 108 (12): 2251-2275 (2020)