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Enhanced Reliability of Fully Differential Difference Amplifier Through On-chip Digital Calibration., , , and . DDECS, page 119-122. IEEE, (2021)Comparison of gate-driven and bulk-driven current mirror topologies., , and . DDECS, page 27-30. IEEE, (2016)Low-Power Rail-to-Rail Comparator in 130 nm CMOS Technology., , , , , and . RADIOELEKTRONIKA, page 1-4. IEEE, (2022)Towards Energy-autonomous Integrated Systems Through Ultra-low Voltage Analog IC Design., , , and . MIXDES, page 38-45. IEEE, (2019)Low-power bulk-driven rail-to-rail comparator in 130 nm CMOS technology., , , and . AFRICON, page 649-652. IEEE, (2017)Design of the Slope Detection Circuit for On-Chip Current Sensing., , , , and . MIXDES, page 111-115. IEEE, (2023)Dynamic Properties Of Ultra Low-Voltage Rail-to-Rail Comparator Designed In 130 nm CMOS Technology., , , , , and . DDECS, page 1-4. IEEE, (2020)Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies., , , and . DDECS, page 395-396. IEEE Computer Society, (2011)Low-voltage bulk-driven variable gain amplifier in 130 nm CMOS technology., , , , and . DDECS, page 40-45. IEEE, (2016)Ultra-low-voltage driver for large load capacitance in 130nm CMOS technology., , , and . DDECS, page 127-132. IEEE, (2017)