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Process-Variation Aware Multi-temperature Test Scheduling.

, , and . VLSID, page 32-37. IEEE Computer Society, (2014)

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Process-variation and temperature aware soc test scheduling using particle swarm optimization., , and . IDT, page 1-6. IEEE, (2011)An efficient temperature-gradient based burn-in technique for 3D stacked ICs., , and . DATE, page 1-4. European Design and Automation Association, (2014)Efficient Test Application for Rapid Multi-Temperature Testing., , and . ACM Great Lakes Symposium on VLSI, page 3-8. ACM, (2015)Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs., , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (12): 2992-3005 (2015)Temperature-gradient based test scheduling for 3D stacked ICs., , and . ICECS, page 405-408. IEEE, (2013)A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs., , and . J. Electron. Test., 31 (5-6): 503-523 (2015)An integrated temperature-cycling acceleration and test technique for 3D stacked ICs., , and . ASP-DAC, page 526-531. IEEE, (2015)Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation., , and . DSD, page 197-204. IEEE Computer Society, (2011)Process-Variation and Temperature Aware SoC Test Scheduling Technique., , and . J. Electron. Test., 29 (4): 499-520 (2013)Process-Variation Aware Multi-temperature Test Scheduling., , and . VLSID, page 32-37. IEEE Computer Society, (2014)