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Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique., , , , , and . IEEE Trans. Instrumentation and Measurement, 57 (11): 2392-2397 (2008)1-20 Ghz kΩ-range BiCMOS 55 nm reflectometer., , , , , , , and . NEWCAS, page 385-388. IEEE, (2014)Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications., , and . IEEE Trans. Instrumentation and Measurement, 63 (5): 1281-1286 (2014)Forward V-band vector network analyzer based on a modified six-port technique., and . WiSNet, page 23-25. IEEE, (2015)Interferometric technique for scanning near-field microwave microscopy applications., , and . I2MTC, page 1694-1698. IEEE, (2013)Measurement accuracy and repeatability in near-field scanning microwave microscopy., , , , and . I2MTC, page 1735-1740. IEEE, (2015)Wide-band 0.9 GHz to 4 GHz Four-Port Receiver., , , , , and . ICECS, page 1316-1319. IEEE, (2006)On-wafer probe station for microwave metrology at the nanoscale., , , , , , and . I2MTC, page 1960-1964. IEEE, (2015)Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurements., , and . ISCAS, IEEE, (2006)Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform., , , and . IEEE Trans. Instrumentation and Measurement, 65 (4): 890-897 (2016)