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Production planning with joint resources usage semiconductor test manufacturing., , , and . CASE, page 49-54. IEEE, (2005)Hierarchical Capacity Planning With Reconfigurable Kits in Global Semiconductor Assembly and Test Manufacturing., , , , , and . IEEE Trans Autom. Sci. Eng., 4 (4): 543-552 (2007)CNN-Based Inter Prediction Refinement for AVS3., , , and . ICME Workshops, page 1-5. IEEE, (2020)Safe Rust Code Recommendation Based on Siamese Graph Neural Network., , and . PRDC, page 1-11. IEEE, (2022)End-to-end unsupervised fault detection using a flow-based model., , , , , and . Reliab. Eng. Syst. Saf., (2021)An overlapping decomposition method for performance analysis of the two-loop closed production system in semiconductor assembly factory., , , , and . Int. J. Comput. Integr. Manuf., 24 (9): 811-820 (2011)Flow shop Scheduling with Reinforcement Learning., , , and . Asia Pac. J. Oper. Res., (2013)YOLOv5-GXT: A New PCB Surface Defect Detection Algorithm Based on YOLOv5., , , , , and . ICACI, page 1-7. IEEE, (2023)DenseNeXt: An Efficient Backbone for Image Classification., , , , , and . ICACI, page 1-6. IEEE, (2023)A Review on Deep Learning Applications in Prognostics and Health Management., , , , , and . IEEE Access, (2019)