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Investigation of on-chip PLL irregularities under stress conditions - case study.

Y. Weizman, Y. Fefer, S. Sofer, and E. Baruch. ICECS, page 591-594. IEEE, (2004)

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Yoav Nebat

Moshe Weizman

Other publications of authors with the same name

Power Analysis Resilient SRAM Design Implemented with a 1% Area Overhead Impedance Randomization Unit for Security Applications.R. Giterman, M. Wicentowski, O. Chertkow, I. Sever, I. Kehati, Y. Weizman, O. Keren, and A. Fish. ESSCIRC, page 69-72. IEEE, (2019)SerOpt: Transistor Sizing Algorithm and Optimization Utility for Minimizing Soft Error Rate.Y. Kra, Y. Weizman, and A. Teman. DCIS, page 1-6. IEEE, (2022)Revisiting Dynamic Logic - A True Candidate for Energy-Efficient Cryogenic Operation in Nanoscaled Technologies.I. Stanger, N. Roknian, N. Shavit, Y. Shoshan, Y. Weizman, A. Teman, E. Charbon, and A. Fish. IEEE Trans. Circuits Syst. I Regul. Pap., 71 (3): 987-999 (March 2024)Vulnerability of secured IoT memory against localized back side laser fault injection.D. Zabib, M. Vizentovski, A. Fish, O. Keren, and Y. Weizman. EST, page 7-11. IEEE, (2017)Investigation of on-chip PLL irregularities under stress conditions - case study.Y. Weizman, Y. Fefer, S. Sofer, and E. Baruch. ICECS, page 591-594. IEEE, (2004)A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10.A. Miller, Y. Shifman, Y. Weizman, O. Keren, and J. Shor. CICC, page 1-4. IEEE, (2019)Low-Cost Side-Channel Secure Standard 6T-SRAM-Based Memory With a 1% Area and Less Than 5% Latency and Power Overheads.Y. Weizman, R. Giterman, O. Chertkow, M. Wicentowski, I. Levi, I. Sever, I. Kehati, O. Keren, and A. Fish. IEEE Access, (2021)Temporal Power Redistribution as a Countermeasure against Side-Channel Attacks.D. Zabib, M. Elkoni, O. Shalom, Y. Weizman, I. Levi, O. Keren, and A. Fish. ISCAS, page 1-5. IEEE, (2020)Compact Protection Codes for protecting memory from malicious data and address manipulations.G. Dar, A. Grigiac, D. Peled, Y. Ashkenazi, M. Goldzweig, Y. Weizman, and O. Keren. ETS, page 1-6. IEEE, (2021)Leakage Power Attack-Resilient Symmetrical 8T SRAM Cell.R. Giterman, M. Vicentowski, I. Levi, Y. Weizman, O. Keren, and A. Fish. IEEE Trans. Very Large Scale Integr. Syst., 26 (10): 2180-2184 (2018)

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Disambiguation of "Weizman, Yoav"

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Investigation of on-chip PLL irregularities under stress conditions - case study.

Please choose a person to relate this publication to

Yoav Nebat

Moshe Weizman

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Weizman, Yoav"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Investigation of on-chip PLL irregularities under stress conditions - case study.

Please choose a person to relate this publication to

Yoav Nebat

Moshe Weizman

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Investigation of on-chip PLL irregularities under stress conditions - case study.