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Low Cost NBTI Degradation Detection and Masking Approaches.

, , , and . IEEE Trans. Computers, 62 (3): 496-509 (2013)

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BTI and leakage aware dynamic voltage scaling for reliable low power cache memories., , , and . IOLTS, page 194-199. IEEE, (2015)Diagnosis of power switches with power-distribution-network consideration., , , and . ETS, page 1-6. IEEE, (2015)Recycled IC detection through aging sensor., , , and . ETS, page 1-2. IEEE, (2018)The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology., , and . Microelectron. Reliab., (2016)Low Cost NBTI Degradation Detection and Masking Approaches., , , and . IEEE Trans. Computers, 62 (3): 496-509 (2013)High-Performance Robust Latches., , and . IEEE Trans. Computers, 59 (11): 1455-1465 (2010)Demonstration of Digital Twins for 5G Connectivity in Industry 4.0., , , , and . NFV-SDN, page 102-103. IEEE, (2021)Smart architectural models: Spatial projection-based augmented mock-up.. Digital Heritage (2), page 677-684. IEEE, (2013)DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (12): 2013-2024 (2015)Checker No-Harm Alarm Robustness., , , and . IOLTS, page 275-280. IEEE Computer Society, (2006)