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Testing Scouting Logic-Based Computation-in-Memory Architectures., , , , , and . ETS, page 1-6. IEEE, (2020)Defect Characterization of Spintronic-based Neuromorphic Circuits., and . IOLTS, page 1-4. IEEE, (2020)A Printed Camouflaged Cell Against Reverse Engineering of Printed Electronics Circuits., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 28 (11): 2448-2458 (2020)Time-Dependent Electromigration Modeling for Workload-Aware Design-Space Exploration in STT-MRAM., , , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (12): 5327-5332 (2022)Runtime Identification of Hardware Trojans by Feature Analysis on Gate-Level Unstructured Data and Anomaly Detection., , and . ACM Trans. Design Autom. Electr. Syst., 25 (4): 33:1-33:23 (2020)Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale., , , , , and . CoRR, (2023)Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations., , , , and . CoRR, (2024)Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking., and . ITC, page 239-248. IEEE, (2022)Security Challenges and Opportunities of Cloud FPGAs.. CCSW@CCS, page 1. ACM, (2023)Neural Networks as a Side-Channel Countermeasure: Challenges and Opportunities., and . ISVLSI, page 272-277. IEEE, (2021)