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Другие публикации лиц с тем же именем

Using Verilog VPI for Mixed Level Serial Fault Simulation in a Test Generation Environment., , и . Embedded Systems and Applications, стр. 139-143. CSREA Press, (2003)FDSOI SRAM cells for low power design at 22nm technology node., , и . MWSCAS, стр. 527-530. IEEE, (2014)Approximate Network-on-Chips with Application to Image Classification., , , и . NAS, стр. 1-8. IEEE, (2022)Protocol Conformance Testing by Discriminating UIO Sequences., , , и . PSTV, стр. 349-364. North-Holland, (1991)On a Novel Self-Test Approach to Digital Testing., и . Comput. J., 30 (3): 258-267 (1987)A Technique for Reconfiguring Two Dimensional VLSI Arrays., , и . RTSS, стр. 44-53. IEEE Computer Society, (1987)Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment., , , , , , , и . IEEE Trans. Instrumentation and Measurement, 52 (6): 1749-1755 (2003)Modeling and analysis of fault tolerant multistage interconnection networks., , и . IEEE Trans. Instrumentation and Measurement, 52 (5): 1509-1519 (2003)Reconfiguring one-time programmable FPGAs., , , , и . IEEE Micro, 19 (6): 53-63 (1999)Testing Layered Interconnection Networks., , , и . IEEE Trans. Computers, 53 (6): 710-722 (2004)